Danmarks Tekniske Universitet 30060946 Anker Engelundsvej 1 Kongens Lyngby 2800 Alexi Burns-Tang +45 93511670 alexi@adm.dtu.dk +45 45252525 www.dtu.dk www.dtu.dk SPM Probe VT STM XA 100-500 Q plus with Matrix DTU need an ultra-high vacuum system equipped with a scanning probe microscope. This system will be used for synthesis of thin films and nanomaterials (for instance, but not limited to, two-dimensional materials, metallic thin films, molecular assembly) and in situ characterization of their structural and electronic properties with scanning probe microscopy techniques (scanning tunneling microscopy/scanning tunneling spectroscopy, and atomic force microscopy). 350000.00 DTU need an ultra-high vacuum system equipped with a scanning probe microscope. This system will be used for synthesis of thin films and nanomaterials (for instance, but not limited to, two-dimensional materials, metallic thin films, molecular assembly) and in situ characterization of their structural and electronic properties with scanning probe microscopy techniques (scanning tunneling microscopy/scanning tunneling spectroscopy, and atomic force microscopy). DTU needs to acquire an ultra-high vacuum system equipped with a scanning probe microscope (SPM). There are multiple suppliers in the market but only Scienta Omnicron can deliver a ultra-high vacuum system that has the below mentioned specifications which are needed to perform the re-search in question. The needed specifications are: — a fast entry chamber for sample loading without breaking vacuum in the SPM chamber, — sample preparation (that is, sample cleaning and deposition of other elements). The scanning probe microscope must have the following capabilities: — working both as a scanning tunneling microscope (STM) and a non-contact AFM with small oscillation amplitudes for high resolution imaging, — Tip motion in X, Y and Z of at least 10 mm x 10 mm x 10 mm, — Scan range of 12μm x 12μm x 1.5μm (X, Y and Z), — In situ evaporation and tip coarse position with sub-micrometer precision for in situ material growth also during imaging, — In situ tip exchange, — Capability of imaging in the range of at least 100 K to 500 K. 2018-05-08 Scienta Omicron GmbH DE 111 361 420 Limburger Str. 75 Taunusstein 65232 ad.ettema@scientaomicron.com www.scientaomicron.com 350000.00 Danish Complaints Board Nævnenes Hus, Toldboden 2 Viborg 8800 +45 35291000 klfu@erst.dk https://erhvervsstyrelsen.dk/klagenaevnet-for-udbud Danish Competition and Consumer Authority Carl Jacobsensvej 35 Valby 2500 2018-05-23
See tender at TED: http://ted.europa.eu/udl?uri=TED:NOTICE:223625-2018:TEXT:EN:HTML