High resolution X-ray diffractometer for powder diffraction and thin film analysis.
Purchase of a Rigaku Smartlab diffractometer for Department of Energy Conversion and Storage, Technical University of Denmark.
The Department has a need for a dedicated high resolution diffractometer for detailed structural analysis of powder and thin film samples, using monochromatic X-ray radiation. The diffractometer will especially be used for:
— High resolution powder diffraction with focus on detailed structural characterization, non-ambient and in situ diffraction.
— High resolution thin film analysis, especially reflectometry, rocking curves and reciprocal space mapping.
The Rigaku Smartlab diffractometer was chosen due to a combination of unique features, which in total uniquely fulfill the performance demands for detailed structural analysis in our present research. Especially the demands for theta-theta geometry, high intensity monochromatic CuK1-radiation and an easy switch between high resolution Bragg Brentano geometry, focusing optics for capillaries and transmission geometry and high quality parallel beam optics with double bounce monochromator and analyzing crystals are uniquely fulfilled.
The diffractometer has a theta-theta goniometer equipped with e.g.: A rotating anode X-ray source, focusing monochromator (CuK1) for Bragg Brentano and capillary geometry (Cross-beam optics with elliptical mirror), parallel beam optics for thin film analysis (2-bounce monochromator and 2-bounce receiving analyzer crystal (Ge(220), CuK1)), a high temperature chamber (1200 K) for reflection and capillary samples, chi-phi circle for thin film characterization, automatic samples changer for reflection and transmission geometry, capillary sample holder with spinning, position sensitive detector and a vertical analyzer crystal suitable for a position sensitive detector.
More details:
The Rigaku Smartlab diffractometer was chosen due to a combination of unique features, which gives the highest possible performance for all applications. Some of the features are:
— Theta-theta geometry with an easy switch between focusing optics (CuK1 radiation) for Bragg-Brentano and capillary geometry for high resolution powder diffraction and parallel beam optics (CuK1 radiation), using 2-bounce Ge(220) monochromators on incident and detector side, for thin film analysis.
— Integrated rotating anode X-ray source (9kW) which gives a high intensity X-ray beam. The Smartlab diffractometer is the only diffractometer offering theta-theta geometry (movable source and detector arms) with a rotating anode source. The very high intensity compared to a sealed-tube source allows faster measurements and more demanding in situ diffraction studies to be performed.
— Automatic procedures for goniometer, optics and sample alignment.